CHEM 6010 Analysis of Materials

The development of modern instrumentation has provided nearly unlimited opportunities in the exploration and understanding of modern materials. This course is planned to educate students in characterization techniques utilized for evaluation and property profiling of bulk and nanosized materials. The major focus of this course will be placed on understating the utility, scope and limitations of various analytical techniques in materials property profiling. The lecture component will incorporate the underlying principles and their utility in materials analysis by Atomic Force Microscopy (AFM), Electron Microscopy (SEM and TEM), Gel Permeation Chromatography (GPC), and MALDI-TOFF. The students will also learn use of XRD, TGA and DSC. An overview to consolidate the knowledge gained in previous analytical courses will also be undertaken to demonstrate utility of FTIR spectroscopy with mapping, UV-vis spectroscopy, Fluorescence and NMR will be undertaken. The laboratory component will deal with synthesis and analysis of real world samples to understand and critical evaluation of these techniques in surface, functional
group, optical, electrical and magnetic property profiling.

Prerequisite(s): Analytical Chemistry 4010 or equivalent, or instructor’s permission
Credits: 4.0